SANTA CLARA, Calif. — Agilent Technologies Inc. (NYSE: A) announced that its N9201A Array Structure Parametric Test Solution won the Semiconductor International 2008 Editor’s Choice Best Product Award for excellence in semiconductor manufacturing. The Editor’s Choice Best Product Award recognizes proven products that have been acknowledged by users for providing superior performance and capabilities in semiconductor manufacturing.
The Agilent N9201A significantly reduces the time engineers need to optimize process parameters and maximize yields. Introduced in October 2006, the Agilent N9201A speeds up the yield ramp-up phase significantly by allowing engineers to test more structures in less time and with greater throughput. It provides fast parallel measurement of array test structures (both passive and addressable), reducing the time engineers need to optimize process parameters and maximize yields.
Filed Under: Semiconductor, Test + measurement • test equipment