When the micro or nanostructure of a surface needs to be measured, an atomic force microscope (AFM) is frequently used. The sharp-tipped silicon AFM can measure the magnetic structure of a surface if it magnetized creating a magnetic force microscope (MFM). For improved measurement capability, NT-MDT uses a thinner coating of the magnetic layer in its Low Moment High Resolution Magnetic Probes, the MFM_LM series. The results are reduced magnetic stray fields that significantly reduce magnetization reversal during imaging and improve quality of the MFM data. This allows magnetic resolution down to 20–30 nm.
For more information about NT-MDT MFM_LM series magnetic probes, click here.
Filed Under: Sensor Tips