Cleveland, Ohio – Keithley Instruments, Inc. (NYSE:KEI) announced an expansion of its Series 3700 System Switch/Multimeter and Plug-in Card Family with the addition of two new plug-in cards, the Model 3724 Dual 1X30 Solid State FET Relay Multiplexer Card and the Model 3750 Multifunction I/O Card. The new cards offer test engineers broader support for a wider variety of switching configurations in order to keep up with the demands of increased testing complexity. For more information on the Model 3724 or the Model 3750, visit http://keithley.acrobat.com/series3700tour.
The Model 3724 Dual 1X30 FET Multiplexer Card features scanning speeds of greater than 1,000 channels/second, including measurement, and switch-only scan rates greater than 1,200 channels/second. The card also offers 200V, 0.1A of switch/carry capacity with offset current of less than 10nA. The long-life solid state relays can be automatically configured into either a dual 1×30 or 1×60 multiplexer. The card also features temperature measurement capability with automatic CJC sensors when used with the optional screw terminal accessory. The Model 3724 can be used in a variety of applications where speed and lifetime are important considerations, such as for R&D and manufacturing in accelerated stress testing, production test, process monitor and control, data acquisition, and device characterization.
The Model 3750 Multifunction I/O Card features 40 digital I/O channels with high-current driver outputs that can sink up to 300mA, allowing them to drive relays directly without any interface circuitry. The Model 3750 also features two programmable analog outputs offering both voltage and current programmable isolated analog outputs including 0-20mA, 4-20mA, or +/-12VDC. It also comes with four totalizers/counters with 32 bit resolution and is gated with a 1MHz input rate. The Model 3750 is ideal for production test applications where interaction with sensors and other mechanical/electrical translation devices are used.
Filed Under: Computer boards, Test + measurement • test equipment
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