NEWS RELEASE – National Instruments announced its first PXI source measure unit (SMU) and the industry’s highest-density PXI switches. These products further enhance the PXI platform for use in precision DC applications, such as semiconductor parametric tests and electronic device and component validation. Engineers can use these modules together to precisely characterize voltage and current parameters on high pin-count devices, with the advantages of smaller size and lower cost compared to traditional approaches.
The NI PXI-4130 power SMU is a programmable, flexible, high-power 3U PXI module suited for precision DC applications. It features a single isolated SMU channel with a four-quadrant ±20 V output that incorporates remote four-wire sense. This channel can source up to 40W in quadrants I and III and sink up to 10W in quadrants II and IV. The PXI-4130 SMU has an additional power supply channel for voltage and current source and readback, combining an SMU with a power supply on a single PXI module. With five available current ranges offering measurement resolution down to 1 nA, the PXI-4130 SMU is a precise and accurate instrument suited for test and design validation applications that require programmatic sourcing and sweeping of voltages and currents.
The NI PXI-2535 and PXI-2536 ultrahigh-density modules offer 544 crosspoints — the largest matrix density available for a single 3U PXI slot. The PXI-2535 is configured as a 4×136 one-wire matrix and the NI PXI-2536 is configured as an 8×68 one-wire matrix. The switch modules are built on field effect transistor (FET) technology, which offers new benefits including unlimited mechanical lifetime, unlimited simultaneous connections and switching speeds as high as 50,000 crosspoints per second. These features make the switches a cost-effective solution for routing low-power DC signals when validating and testing mass-produced devices such as semiconductor chips. Engineers can use the new switches with NI Switch Executive switch management software for simple configuration and code reuse.
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Filed Under: Switches, TEST & MEASUREMENT