The Kelvin Probe Force Microscopy (KPFM) mode and its line of atomic force microscopes (AFMs) uses frequency-modulation detection to provide the highest spatial resolution Kelvin probe data. It builds on Tapping™ technology to provide directly correlated quantitative nanomechanical data, which improves the sensitivity of the frequency-modulation measurement and eliminates artifacts. In addition, KPFM provides a completely automated parameter setup with ScanAsyst®, resulting in quantitative surface potential data for materials research as well as semiconductor applications.
Bruker Corporation
www.bruker.com
Filed Under: Test & Measurement Tips
