Salem, NH – Seica SpA
presents the new portable Break Out Box PTE-100, designed for 1st level
functional test with outstanding stimuli/measurement capabilities unique in
its genre.

Based on Seica’s standard VIP architecture, including the DSP ACL module,
the PTE-100 combines the features of different instruments like voltage
generator, current generator, waveform generator, voltmeter, amperometer,
frequency meter and oscilloscope, with the typical features of an automatic
test system. It is also equipped with a mid-range power relay matrix (500V
@2A) with switching and interrupt functions of up to 256 input/output
channels.

The PTE-100 is ideal for diagnosing and identifying in field faults in the
electronic systems aboard helicopters, trains, planes and systems made up
of electronic modules interconnected through cables equipped with break out
connectors. The PTE-100 is connected between two modules to monitor the
activity present on the interconnect cable, and can execute
stimuli/measurement operations as well as simply connect/interrupt every
single wire of the cable itself, to facilitate the diagnosis of the problem
by an expert user.

The numerous integrated hardware functions and its fully “general purpose”
architecture, make the PTE-100 perfect for replacing the many different
break out boxes dedicated to specific applications, dramatically decreasing
the weight and volume of the equipment which the maintenance technician must
carry in order to do his job in the field: the user of the PTE-100 has a
powerful set of instruments contained in a truly portable box that easily
fits into a common trolley-type case, ensuring both protection and
transportability.

Thanks to the innovative Seica “Quick Test” software, which provides a
completely graphical, extremely easy to use interface, the PTE-100 can be
used in the same manual mode typical of a lab instrument , or in an
automatic, “ATE” mode, executing previously stored test sequences, thus
providing the user with the maximum flexibility.

Seica

www.seica.com

::Design World::

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Filed Under: Aerospace + defense, Electronics • electrical, Software, Test + measurement • test equipment

 

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