Qualtera has unveiled Silicondash, an automated Decision Support System (DSS) for semiconductor test data analysis. Silicondash provides a complete solution to rapidly identify, analyze, and react to test, quality and yield issues. Compared to existing approaches Silicondash brings an exceptional improvement in engineering productivity. Silicondash is currently used in high-volume beta trials with major European semiconductor IDMs and is available now.
Qualtera has developed Silicondash as a solution for fabless companies, IDMs, foundries and test houses that need more relevant and timely information from the semiconductor manufacturing chain. This analytical data is then used to rapidly improve test efficiency, yield and quality.
By using Silicondash, engineers can analyze and report compiled test data within in minutes. Very detailed statistical root cause analysis, as well as high-level aggregated summary reports are accessible in just a couple of clicks.
Silicondash provides a real-time, detailed overview of the entire manufactured volume, making it extremely easy to identify, analyze and act on quality or yield issues in manufacturing and test processes.
Implemented as a cloud-hosted service, Silicondash does not require software to be installed locally and allows engineers in multiple locations to securely access and share data in real-time, providing full transparency in the semiconductor manufacturing and test processes.
To ensure users of Silicondash have easy access to the progress, daily, weekly or quarterly overview reports are generated and updated on a real time basis, providing easy drill-down features and custom feedback alerts set up for early problem detection.
Filed Under: Semiconductor, Test + measurement • test equipment