Design World

  • Home
  • Technologies
    • 3D CAD
    • Electronics • electrical
    • Fastening & Joining
    • Factory automation
    • Linear Motion
    • Motion Control
    • Test & Measurement
    • Sensors
    • Fluid power
  • Learn
    • Ebooks / Tech Tips
    • Engineering Week
    • Future of Design Engineering
    • MC² Motion Control Classrooms
    • Podcasts
    • Videos
    • Webinars
  • LEAP AWARDS
  • Leadership
    • 2022 Voting
    • 2021 Winners
  • Design Guide Library
  • Resources
    • 3D Cad Models
      • PARTsolutions
      • TraceParts
    • Digital Issues
      • Design World
      • EE World
    • Women in Engineering
  • Supplier Listings

Samsung Investigating Galaxy S8 ‘Iris Hack’

By Phys.org | May 24, 2017

Share

Samsung Electronics is investigating claims by a German hacking group that it fooled the iris recognition system of the new flagship Galaxy S8 device, the firm said Wednesday.

The launch of the Galaxy S8 was a key step for the world’s largest smartphone maker as it sought to move on from last year’s humiliating withdrawal of the fire-prone Galaxy Note 7s, which hammered the firm’s once-stellar reputation.

But a video posted by the Chaos Computer Club (CCC), a German hacking group founded in 1981, shows the Galaxy S8 being unlocked using a printed photo of the owner’s eye covered with a contact lens to replicate the curvature of a real eyeball.

“A high-resolution picture from the internet is sufficient to capture an iris,” CCC spokesman Dirk Engling said, adding: “Ironically, we got the best results with laser printers made by Samsung.”

A Samsung spokeswoman said it was aware of the report and was investigating.

The iris scanning technology was “developed through rigorous testing”, the firm said in a statement as it sought to reassure customers.

“If there is a potential vulnerability or the advent of a new method that challenges our efforts to ensure security at any time, we will respond as quickly as possible to resolve the issue.”

Samsung’s hopes of competing against archrival Apple’s iPhone had been pinned on the Galaxy S8 after last year’s Note 7 disaster.

The recall debacle cost Samsung billions of dollars in lost profits and hammered its global credibility, forcing it to apologise to consumers and postpone the S8 launch.

But since it was released in April it has received positive reviews and strong orders.

The CCC previously demonstrated a way to defeat Apple’s TouchID fingerprint sensors—using graphite powder, a laser etching machine and wood glue—just weeks after the first iPhone 5s hit the shelves.

Traditional PIN protection was “a safer approach than using body features for authentication”, Engling said.


Filed Under: M2M (machine to machine)

 

Related Articles Read More >

Part 6: IDE and other software for connectivity and IoT design work
Part 4: Edge computing and gateways proliferate for industrial machinery
Part 3: Trends in Ethernet, PoE, IO-Link, HIPERFACE, and single-cable solutions
Machine Learning for Sensors

DESIGN GUIDE LIBRARY

“motion

Enews Sign Up

Motion Control Classroom

Design World Digital Edition

cover

Browse the most current issue of Design World and back issues in an easy to use high quality format. Clip, share and download with the leading design engineering magazine today.

EDABoard the Forum for Electronics

Top global problem solving EE forum covering Microcontrollers, DSP, Networking, Analog and Digital Design, RF, Power Electronics, PCB Routing and much more

EDABoard: Forum for electronics

Sponsored Content

  • Renishaw next-generation FORTiS™ enclosed linear encoders offer enhanced metrology and reliability for machine tools
  • WAGO’s smartDESIGNER Online Provides Seamless Progression for Projects
  • Epoxy Certified for UL 1203 Standard
  • The Importance of Industrial Cable Resistance to Chemicals and Oils
  • Optimize, streamline and increase production capacity with pallet-handling conveyor systems
  • Global supply needs drive increased manufacturing footprint development

Design World Podcasts

June 12, 2022
How to avoid over engineering a part
See More >
Engineering Exchange

The Engineering Exchange is a global educational networking community for engineers.

Connect, share, and learn today »

Design World
  • Advertising
  • About us
  • Contact
  • Manage your Design World Subscription
  • Subscribe
  • Design World Digital Network
  • Engineering White Papers
  • LEAP AWARDS

Copyright © 2022 WTWH Media LLC. All Rights Reserved. The material on this site may not be reproduced, distributed, transmitted, cached or otherwise used, except with the prior written permission of WTWH Media
Privacy Policy | Advertising | About Us

Search Design World

  • Home
  • Technologies
    • 3D CAD
    • Electronics • electrical
    • Fastening & Joining
    • Factory automation
    • Linear Motion
    • Motion Control
    • Test & Measurement
    • Sensors
    • Fluid power
  • Learn
    • Ebooks / Tech Tips
    • Engineering Week
    • Future of Design Engineering
    • MC² Motion Control Classrooms
    • Podcasts
    • Videos
    • Webinars
  • LEAP AWARDS
  • Leadership
    • 2022 Voting
    • 2021 Winners
  • Design Guide Library
  • Resources
    • 3D Cad Models
      • PARTsolutions
      • TraceParts
    • Digital Issues
      • Design World
      • EE World
    • Women in Engineering
  • Supplier Listings