Design World

  • Home
  • Technologies
    • 3D CAD
    • Electronics • electrical
    • Fastening & Joining
    • Factory automation
    • Linear Motion
    • Motion Control
    • Test & Measurement
    • Sensors
    • Fluid power
  • Learn
    • Ebooks / Tech Tips
    • Engineering Week
    • Future of Design Engineering
    • MC² Motion Control Classrooms
    • Podcasts
    • Videos
    • Webinars
  • LEAP AWARDS
  • Leadership
    • 2022 Voting
    • 2021 Winners
  • Design Guide Library
  • Resources
    • Subscribe!
    • 3D Cad Models
      • PARTsolutions
      • TraceParts
    • Digital Issues
      • Design World
      • EE World
    • Women in Engineering
  • Supplier Listings

Semiconductor Testing Suite

By Kathleen Zipp | April 12, 2007

Share

Keithley Instruments, Inc. recently released the ACS (Automated Characterization Suite) integrated test systems for semiconductor characterization at the device, wafer, and cassette level. The suite has unique measurement capabilities, as well as automation-oriented software. Visit www.keithley.com/pr/070 for more information.

Within the ACS Suite, the company’s integrated test systems use a variety of test hardware and overall unique measurement capability:

Model 4200-SCS Semiconductor Characterization System has I-V source-measure and pulse testing packages. The Model 4200-PIV package tests advanced semiconductor materials.

Series 2600 SourceMeter Instruments use TSP-Link and Test Script Processor (TSP) for scalable I-V channel count systems, fast parallel measurements, and complex test sequences for on-the-fly NBTI, on-wafer component characterization, and other applications. Series 2400 SourceMeter Instruments have high voltage and high current sourcing, which are unique in applications such as high power MOSFETs and display drivers.

Other instruments within the ACS test system family include: optional switching, C-meters, and pulse generators.

The systems come in basic bench-top configurations or in factory-integrated full-height rack configurations.

The ACS systems also have a Wafer Description Utility and wafer map. Users can build wafer description files with integrated test plans. Test results are seen immediately (via pass/fail metrics) from real-time updating of color-coded wafer maps during test execution.

The systems have an interactive prober controller. Using ACS software, users can control wafer movement during test development to validate test setups on actual structures and during lot disposition. This way, they can move to the area on the wafer that is causing the problem and test manually. A full range of drivers gives sound integration with a choice of semiautomatic and fully automatic probers.

ACS.jpg

Want to know more about Keithley?

Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891

Tel: 800-688-9951 (toll-free)
Tel: 440-248-0400 Fax: 440-248-6168

E-mail: [email protected]
Web: www.keithley.com


:: Design World ::


Filed Under: Semiconductor

 

Tell Us What You Think!

Related Articles Read More >

sager electronics
Sager Electronics adds electronic CAD file accessibility in online catalog
Samsung Foundry certifies analog FastSPICE platform from Siemens for early design starts on 3nm GAA process technology
richardson
Richardson Electronics to offer Fuji Electric 7th-generation (X-Series) IGBT modules
How to get the most from flash storage

DESIGN GUIDE LIBRARY

“motion

Enews Sign Up

Motion Control Classroom

Design World Digital Edition

cover

Browse the most current issue of Design World and back issues in an easy to use high quality format. Clip, share and download with the leading design engineering magazine today.

EDABoard the Forum for Electronics

Top global problem solving EE forum covering Microcontrollers, DSP, Networking, Analog and Digital Design, RF, Power Electronics, PCB Routing and much more

EDABoard: Forum for electronics

Sponsored Content

  • Industrial disc pack couplings
  • Pushing performance: Adding functionality to terminal blocks
  • Get to Know Würth Industrial Division
  • Renishaw next-generation FORTiS™ enclosed linear encoders offer enhanced metrology and reliability for machine tools
  • WAGO’s smartDESIGNER Online Provides Seamless Progression for Projects
  • Epoxy Certified for UL 1203 Standard

Design World Podcasts

July 26, 2022
Tech Tuesdays: Sorbothane marks 40 years of shock and vibration innovation
See More >
Engineering Exchange

The Engineering Exchange is a global educational networking community for engineers.

Connect, share, and learn today »

Design World
  • Advertising
  • About us
  • Contact
  • Manage your Design World Subscription
  • Subscribe
  • Design World Digital Network
  • Engineering White Papers
  • LEAP AWARDS

Copyright © 2022 WTWH Media LLC. All Rights Reserved. The material on this site may not be reproduced, distributed, transmitted, cached or otherwise used, except with the prior written permission of WTWH Media
Privacy Policy | Advertising | About Us

Search Design World

  • Home
  • Technologies
    • 3D CAD
    • Electronics • electrical
    • Fastening & Joining
    • Factory automation
    • Linear Motion
    • Motion Control
    • Test & Measurement
    • Sensors
    • Fluid power
  • Learn
    • Ebooks / Tech Tips
    • Engineering Week
    • Future of Design Engineering
    • MC² Motion Control Classrooms
    • Podcasts
    • Videos
    • Webinars
  • LEAP AWARDS
  • Leadership
    • 2022 Voting
    • 2021 Winners
  • Design Guide Library
  • Resources
    • Subscribe!
    • 3D Cad Models
      • PARTsolutions
      • TraceParts
    • Digital Issues
      • Design World
      • EE World
    • Women in Engineering
  • Supplier Listings