Edited by Leslie Langnau, Managing Editor Vibration isolation and better scan size enables atomic force microscopy (AFMs) to see more at the nanoscale level. With its development in 1986, and subsequent commercial introduction in 1989, the atomic force microscope (AFM) is one of the foremost tools for imaging and measuring materials and cells on the…

Minus K Technology has just released a compact, high-capacity, low-frequency negative-stiffness isolator designed to support heavy payloads while reducing low-frequency vibrations. The new CM-1 isolator comes in several capacity ranges to match vibration-sensitive instruments such as SPMs (AFMS, STMs, etc), micro-hardness testers, profilers, interferometers, electron microscopes, or other imaging systems, for weight loads from 50…