Cleveland, OH – Keithley Instruments, Inc. (NYSE: KEI) will broadcast a free, web-based seminar titled Tips, Tricks, and Traps for On-Wafer Probing on Thursday, January 28, 2010. This one-hour seminar will demonstrate the best practices for on-wafer probing and how to identify and solve common problems. To register for this event, visit www.keithley.com/events/semconfs/webseminars.
Test engineers often need to perform various on-wafer measurements using semi-automatic probers. It is often difficult to achieve accurate measurements due to problems in the interconnect between the test equipment and the prober. Those who attend this seminar will learn:
*How to cable for accurate low current DC measurements, accurate CV measurements, and ultra fast and pulsed IV measurements;
*The benefits of using Keithley-supplied cables and accessories to perform DC, CV, and ultra fast and pulsed IV measurements;
*Proper grounding and guarding techniques;
*Selecting the proper types of interconnect cables;
*How to troubleshoot interconnect problems.
The event will conclude with a text-based Q&A session.
Tips, Tricks, and Traps for On-Wafer Probing is recommended for test engineers and test engineering managers who have a basic understanding of wafer probing. The content is appropriate for engineers working with on-wafer devices.
Dave Rose, a senior staff applications engineer at Keithley in Cleveland, Ohio, will present the seminar. Rose joined Keithley in 1987 and has spent roughly half of his career in design engineering and the other half in applications engineering.
Tips, Tricks, and Traps for On-Wafer Probing will be broadcast on Thursday, January 28, 2010 at 15:00 CET (9:00 a.m. EST) for the European audience and at 2:00 p.m. EST for the North American audience. The event is free to the public, but participants must register in advance at www.keithley.com/events/semconfs/webseminars. The seminar will also be archived on Keithley’s website for those unable to attend the original broadcast.
Keithley Instruments, Inc.
www.keithley.com
::Design World::
Filed Under: TEST & MEASUREMENT, ELECTRONICS • ELECTRICAL