Meller Optics, Inc. announces a new x-ray goniometry service that provides a complete lattice orientation of single crystals and is suitable for a wide variety of materials, regardless of size and weight.
- Measures the complete lattice orientation of single crystals with precision up to (1/100)° and provides a misalignment report of tilt and azimuth
- Service can be performed with material samples ranging from 0.25” sq. up to 20kg ingots
- Ideal for sapphire, single-crystal quartz, silicon, MgF2, CaF2, BaF2, spinel and other materials
- Service is typically performed to validate orientation when thermal-expansion, -coefficient, and the index of refraction needs to be constant in all directions, and when birefringence must be minimum or maximum, and polarization effects are critical
Filed Under: Materials • advanced