Capacitance: Friend and Foe

By David Herres Capacitance is everywhere. Electronic circuits make use of this phenomenon of the physical universe because of it can be used to separate dc from high-frequency signals,…

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Mitigating Harmful Effects of Capacitance and Inductance

By David Herres Capacitive and inductive reactances are present throughout electrical equipment in proportion to the frequencies used. This is particularly true in long transmission lines. But then…

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ATS for RF, mixed-signal devices uses PXI-based approach

NI (Nasdaq: NATI) announced the NI Semiconductor Test System (STS) series. These PXI-based automated test systems reduce test cost for RF and mixed-signal devices by opening access to…

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Grounding: Is that instrument really grounded?

By David Herres When using a bench oscilloscope,  it is critical that the scope and the work be reliably grounded, assuming they both connect to an external power source….

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Averna and JOT Automation Announce a Technology Partnership

Averna, a developer of test solutions and services for communications and electronics device-makers worldwide, and JOT Automation, a supplier of automated test and production solutions, announced a technology…

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AMETEK Taylor Hobson 500H measures roundness, profile and surface finish

A precision surface measurement tool featuring a high-speed column drive, precision positioning and 4mm roundness and contour gauge has been introduced by Taylor Hobson, a unit of AMETEK,…

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Tektronix Waveform Monitors Meet 4K Needs of Production, Post-Production and Broadcast Markets

Tektronix, an innovator of video quality monitoring solutions, announced that its WFM8200 and WFM8300 waveform monitors and WVR8200 and WVR8300 rasterizers can now be easily upgraded via software…

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PEG Coordinate Measuring Machine Improves Accuracy

Precision Electronic Glass (PEG) recently installed a coordinate measuring machine to perform nondestructive measurements of complex shapes. Accurate measurements are critical to meeting stringent specifications and assuring consistency…

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Yokogawa Obtains ISASecure® EDSA Certification for CENTUM®

Yokogawa Electric Corporation announces that its CENTUM® VP production control system has obtained the ISASecure® Embedded Device Security Assurance (EDSA) certification from the ISA Security Compliance Institute (ISCI)…

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Hexagon Metrology Releases HP-O Optical Measurement Solution

Hexagon Metrology announced the release of the new-to-the-market HP-O non-contact scanning probe for high accuracy measurement and inspection applications. The non-contact probe is an attractive alternative to conventional…

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New Low-Cost 16-Bit DAQ from Measurement Computing

Measurement Computing Corporation, a provider in data acquisition, announced the release of two, 16-bit, multifunction USB DAQ devices with sample rates up to 100 kS/s. The USB-230 Series…

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Accudyne AC Dynamometer Testing System For Wind Power

SAKOR Technologies, Inc., a recognized provider in the implementation of instrumentation products for dynamometer testing, announces the availability of its complete AccuDyne™ AC Dynamometer system for wind power…

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Yokogawa Corporation of America Releases DT450G Dust Monitor

Yokogawa Corporation of America announces the release of the model DT450G dust monitor. The DT450G detects the qualitative level of dust or particulate matter by working off of…

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Fluke Ti90 and Ti95 Infrared Cameras

Fluke Corporation expands the Fluke Connect™ system with the new Ti90 and Ti95 Infrared Cameras with wireless connectivity making them ideal for maintenance, troubleshooting, and HVAC/R technicians, electricians,…

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Saelig Introduces New MSO Oscilloscopes

Saelig Company, Inc. has announced the availability of MSO functionality to their range of Rigol DS2000A and DS1000Z scopes. The mixed-signal extension provides digital signal debug capabilities to…

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Portable Degas System Offers Choice of Vacuum Pumps

A portable degas system that can be tailored to customer requirements with a choice of vacuum pumps, gauges, chamber sizes, feed-throughs, and more has been introduced by MV…

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HEIDENHAIN to Share “Dynamic” Insights at IMTS

From HEIDENHAIN Corporation, comes an opportunity to view its newest and most impressive products for machine tools at this year’s International Manufacturing Technology Show (IMTS) 2014in Chicago (…

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HEIDENHAIN to Share “Dynamic” Insights at IMTS

From HEIDENHAIN Corporation, comes an opportunity to view its newest and most impressive products for machine tools at this year’s International Manufacturing Technology Show (IMTS) 2014in Chicago (…

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Mitutoyo Releases CV-2100N4 and M4 Contracers

Mitutoyo America announces the addition of new CV-2100N4 and M4 Contracers to their line of Form Measurement Instruments. These new models replace the already successful CV-1000N2/2000M4 models. The…

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MicroSense ships Novel LED Sapphire Wafer Measurement Tools for Process Control

MicroSense, LLC, a developer of non-contact wafer metrology systems, today announced multiple shipments of its new, next-generation automated sapphire wafer metrology tool, the MicroSense UltraMap C200. Designed specifically…

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Tektronix Helps Video Service Providers Ensure Regulatory Compliance

Tektronix, a provider of broadcast video test, monitoring and analysis solutions, today announced the addition of significant new monitoring capabilities to its award-winning Sentry family of digital content…

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Yokogawa Announces ISO 17025 Accreditation for Calibration Lab

Yokogawa Corporation of America has announced that its Newnan, GA facility’s Calibration Laboratory has been awarded ISO/IEC 17025:2005 accreditation from the American Association for Laboratory Accreditation (A2LA). Yokogawa…

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NEW TandD Multichannel Recorder MCR-4TC

It runs on two AA alkaline batteries and supports thermocouple types K, J, T, S, and R. Up to 4 units can be coupled together, making it possible…

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Tektronix Delivers New BERTScope Model

Tektronix, Inc., a provider of test, measurement and monitoring instrumentation, today introduced the BSA286CL BERTScope Bit Error Rate Tester. The BSA286CL is designed for the low intrinsic jitter…

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CMS Introduces Level-Two Certification Program

Level-One and Level-Two Certification Examinations to be held at Coordinate Metrology Systems Conference The Coordinate Metrology Society (CMS), the eminent membership association for measurement professionals, today announces the…

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