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Keithley’s E-Guide on Making Ultra-Fast I-V Measurements

By Natasha Townsend | July 17, 2012

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Keithley Instruments, Inc. has published an e-guide titled, “Ultra-Fast I‑V Applications for the Model 4225-PMU Ultra-Fast I-V Module.”

The 24-page e-guide provides an overview of why ultra-fast I-V sourcing and measurement have become increasingly important capabilities for many technologies, including compound semiconductors, non-volatile memory (NVM), MEMs devices, nanodevices, solar cells, and CMOS devices. Using pulsed I-V signals to characterize devices rather than dc signals makes it possible to study or reduce the effects of self-heating (joule heating) or to minimize current drift or degradation in measurements due to trapped charge. Each plug-in module provides two channels of integrated sourcing and measurement, but occupies only a single slot in the Model 4200-SCS’s nine-slot chassis. Each channel of the module combines high-speed voltage outputs (with pulse widths ranging from 60 nanoseconds to DC) with simultaneous current and voltage measurements.

The e-guide outlines a number of the Model 4225-PMU’s key features:

  • Integrated high speed sourcing and measurement capabilities, which allow for ultra-fast I‑V testing
  • Wide dynamic range of voltage sourcing, current measurement (with auto-ranging), and timing parameters
  • Broad array of applications
  • Built-in interactive software for easy control

Example applications described include:

  • General pulsed I-V testing of devices
  • CMOS device characterization
  • Non-volatile memory device testing
  • Compound semiconductor devices and materials
  • Nanotechnology and MEMs devices
  • Solar cells
  • A broad range of other tests

Keithley Instruments
www.keithley.com

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Filed Under: Power Electronic Tips
Tagged With: keithleyinstruments
 

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