Keithley Instruments, Inc. has published an e-guide titled, “Ultra-Fast I‑V Applications for the Model 4225-PMU Ultra-Fast I-V Module.”
The 24-page e-guide provides an overview of why ultra-fast I-V sourcing and measurement have become increasingly important capabilities for many technologies, including compound semiconductors, non-volatile memory (NVM), MEMs devices, nanodevices, solar cells, and CMOS devices. Using pulsed I-V signals to characterize devices rather than dc signals makes it possible to study or reduce the effects of self-heating (joule heating) or to minimize current drift or degradation in measurements due to trapped charge. Each plug-in module provides two channels of integrated sourcing and measurement, but occupies only a single slot in the Model 4200-SCS’s nine-slot chassis. Each channel of the module combines high-speed voltage outputs (with pulse widths ranging from 60 nanoseconds to DC) with simultaneous current and voltage measurements.
The e-guide outlines a number of the Model 4225-PMU’s key features:
- Integrated high speed sourcing and measurement capabilities, which allow for ultra-fast I‑V testing
- Wide dynamic range of voltage sourcing, current measurement (with auto-ranging), and timing parameters
- Broad array of applications
- Built-in interactive software for easy control
Example applications described include:
- General pulsed I-V testing of devices
- CMOS device characterization
- Non-volatile memory device testing
- Compound semiconductor devices and materials
- Nanotechnology and MEMs devices
- Solar cells
- A broad range of other tests
Keithley Instruments
www.keithley.com
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