The E6607B EXT wireless communications test set and companion E6617A multiport adapter is optimized for non-signaling testing. The EXT/MPA combination increases test throughput and reduces the cost of test in the manufacturing of current- and next-generation smartphones and tablets that contain multiformat and multiband technologies.
The EXT is an integrated one-box tester that includes a vector signal analyzer, vector signal generator, high-speed sequence analyzer and multiformat hardware. It offers future-ready capabilities such as full cellular-band coverage up to 3.8 GHz (including LTE TDD Band 43) and support for the fast-sequenced test modes implemented in the latest chipsets. The E6607B is fully backward compatible in terms of form, fit and function with the previous-generation E6607A EXT.
The compact and cost-effective MPA adds simultaneous receiver testing, sequential transmitter testing and simultaneous GPS testing of up to four dual-antenna devices at a time. It does this through plug-and-play connectivity to the EXT and fully calibrated ports-eight cellular, four GPS-that extend the test plane to the MPA front panel.
The EXT can be configured with a variety of X-Series measurement applications for cellular communications, wireless connectivity and digital audio/video. The new EXT test set includes three additions: LTE TDD, TD-SCDMA and analog demodulation. Individual X-Series measurement applications can be included with the original instrument purchase or added later.
A comprehensive set of complementary software tools accelerates test development. For example, Agilent Signal Studio makes it easy to create non-signaling downlink signals (control and test) for use with the EXT. In preproduction, Agilent Sequence Studio enables engineers to quickly create and troubleshoot test plans. To help accelerate time-to-volume, Agilent’s chipset software provides a graphical user interface and programming interface to enable device control, calibration and verification.
Agilent Technologies
www.agilent.com
Filed Under: Test & Measurement Tips