Quality control is critical in solar cell wafer production. The latest tools used to detect defects are cameras, like the TXG14NIR. This camera is one of a selection of TX industrial cameras that solve several critical measurement tasks in the production of solar cells.
With enhanced sensitivity in the near infrared (NIR), it facilitates automatic inspection of solar cell wafers. Measuring electroluminescence (EL) using NIR imaging cameras will detect fractures as well as failures in the crystal structure. The images give information on the integrity and effectiveness of each wafer prior to the next processing step.
The TXG14NIR camera has high sensitivity at the required wavelengths and simultaneously delivers high resolution images with 1392 x 1040 pixels. Structural defects within the wafer can be easily detected, enabling better quality control in any wafer handling process.
Filed Under: Electronics • electrical, Green engineering, Test + measurement • test equipment, Vision • machine vision • cameras + lenses • frame grabbers • optical filters